Lumetrics Introduces Scanning System For Off-line Thickness Gauging Of Specialty Films And Flexible Packaging

Lumetrics Introduces Scanning System For Off-line Thickness Gauging Of Specialty Films And Flexible Packaging

(source: Lumetrics press release)

Lumetrics Inc. of Rochester, N.Y. has announced the introduction of an off-line scanning system combined with their OPTIGAUGE™ film thickness measurement system. The OPTIGAUGE system has been combined with a scanning system to provide rapid, yet detailed analysis of complex film compositions.

OPTIGAUGE employs optical technology to measure absolute thickness to an accuracy of ± 0.1 micrometer (± 0.004 mil), a specification guaranteed by continuous calibration with a built-in reference standard, according to the company press release. Also according to the press release, virtually any translucent multi-layer film or laminate can be analyzed in detail because the thickness of every layer is measured simultaneously.

For more information visit www.lumetrics.net or call 585/214-2455.

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